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HORIBA Jobin Yvon has unveiled the next-generation GD-PROFILER(TM) 2 glow discharge spectrometer, a powerful tool designed for high-resolution depth profiling. This advanced system incorporates a cutting-edge high-speed electronics design that delivers an impressive depth resolution of less than 1nm, making it ideal for precise material analysis at the nanoscale.
The instrument is equipped with a well-established pulsed RF source, which ensures reliable performance when analyzing both conductive and non-conductive materials, even those sensitive to heat. This makes it particularly useful in industries where sample integrity is critical.
One of the standout features of the GD-PROFILER(TM) 2 is its unique HDD detector, which provides an extraordinary dynamic range of up to ten orders of magnitude for each element being analyzed. This allows for accurate detection of trace elements alongside major components, all within a single measurement.
In addition, the large sample chamber enhances the versatility of the system, enabling the analysis of a wide range of sample sizes and shapes. Whether you're working with small thin films or larger bulk samples, this spectrometer offers flexibility and precision that sets it apart from other systems on the market.
With its combination of speed, accuracy, and adaptability, the GD-PROFILER(TM) 2 is a game-changer for researchers and quality control professionals looking to push the boundaries of surface and depth analysis.